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Patents

  1. Wang J.Y., Chen Y.S., Device for reading indicator value of arrow-type and niddle-type meter with computer vision and method thereo, Patent No. I669512, Republic of China, Aug. 21, 2019 - Aug. 29, 2038, 2019.
  2. Chen Y.S., Wang J.Y., Device for reading resistor value with computer vision and method thereof, Patent No. US 9,959,616 B2, United States, 2018/5/1 ~, 2018.
  3. Chen Y.S., Wang J.Y., Device for reading resistor value with computer vision and method thereof, Patent No. I587221, Republic of China, June 11, 2017 - Feb. 1, 2036, 2017.
  4. Chen Y.S., Hsu W.H., Thinning And Feature Extraction For Binary Image And Processing Device Thereo, Patent No. 2872714, Japan, Jan. 8, 1999 - , 1999.
  5. Chen Y.S., Fully automatic methodology for seal matching and its device, Patent No. 093714, Republic of China, March 21, 1998 - July 15, 2016, 1998.
  6. Hsu W.H., Chen Y.S., Thinning And Feature Extraction For Binary Image And Processing Device Thereo, Patent No. 42092, Republic of China, Sept. 21, 1990 - Sept. 20, 2005, 1990.